1-Day Seminar: Mass Metrology in Advanced Semiconductor Processing

Metryx is pleased to present a one-day seminar on the implementation of mass metrology in the production of advanced semiconductor devices. Speakers will be drawn from leading integrated device manufacturers where mass metrology has been successfully implemented as an in-line, on-product wafer technique for monitoring process changes and excursions. In addition, the meeting will look at the role of mass metrology in the development of processes for advanced technology nodes. 

Date: 8th April, 2008
Location: IMEC, Leuven, Belgium

Technical program: The preliminary program will feature speakers from Metryx, IMEC, Qimonda, ST Microelectronics and AMD among others. Details of the speakers and specific subject matter will be released officially later this month.

How to register: There is no charge for attending this seminar. Attendees must pre-register by sending an email to seminar@metryx.net

How to get there: The seminar will be held in the lobby and auditorium of IMEC’s Leuven facility. Leuven is only 25km from Brussels and its international airport and there is a regular train service direct from the airport to Leuven city centre where a short taxi ride will take you to IMECs facility.

Where to stay: Leuven and nearby Brussels offer a wide range of hotels and guesthouses. Special rates will be available for registered attendees at the Novotel in Leuven.

For addition details please contact Mark Berry directly on +44 (0) 127 585 9988

About Metryx: Metryx is a semiconductor equipment manufacturer specializing in unique nanotechnology mass measurement techniques. Based in Bristol, England, Metryx’s non-destructive 200mm and 300mm metrology tools offer atomic layer accuracy making them ideal for material characterization and device manufacture process control. For more information on the company and its products please visit www.metryx.net

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