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PRESS ROOM

|Current PR|

Metryx and Hermes-Epitek Sign Mass Metrology Sales and Service Agreement for Taiwan, China and Singapore

Metryx Receives 2008 Queen's Award for Innovation

Metryx to Host One-Day Mass Metrology Seminar at IMEC
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Metryx Receives Multiple System Follow-On Order from Inotera
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Metryx and IMEC Enter Joint Development Program for Sub-32nm Metrology
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METRYX WINS MULTI-SYSTEM MENTOR ORDER FROM RESEARCH CONSORTIUM
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METRYX MENTOR WINS SEMICONDUCTOR INTERNATIONAL'S EDITOR'S CHOICE BEST PRODUCT 2007
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METRYX WINS EUROASIA SEMICONDUCTOR IC INDUSTRY BEST STARTUP AWARD 2007
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METRYX RECEIVES QUEEN’S AWARD FOR ENTERPRISE
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METRYX ENTERS JAPANESE MARKET IN COOPERATION WITH CANON MARKETING JAPAN
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METRYX EXPANDS GLOBAL INFRASTRUCTURE TO MEET GROWING DEMAND FOR MASS METROLOGY
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METRYX RECIEVES MASS METROLOGY PRODUCTION TOOL ORDER FROM KEY US GaAS MANUFACTURER
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METRYX WINS NEW ORDERS FOR ITS MASS METROLOGY PRODUCTION TOOL
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ELTON PEACE OF LAM RESEARCH JOINS METRYX ADVISORY BOARD
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NANOTECHNOLOGY MASS METROLOGY PROVIDES FULLY AUTOMATED SOLUTION TO 300MM FABS
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VERSATILE HIGH VOLUME MIXED WAFER METROLOGY TOOL OFFERS ATOMIC LAYER MEASUREMENT ACCURACY
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METRYX APPOINTS NORTH AMERICAN TECHNOLOGY DIRECTOR
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