News Archive

Metryx Announces Participation in Joint European SEAL Project

Metryx to Sponsor Upcoming IITC, ASMC and FCMN Conferences

Metryx Sees Increased Adoption of Mass Metrology for 300 mm; Strong Growth Potential in Key New Areas Including MEMS, LEDs, and 3D IC Applications

HRH The Duke of York to Visit Metryx After Second Queen's Award Win

Metryx Receives Follow-on Order from US Based GaAs Manufacturer

Metryx and Hermes-Epitek Sign Mass Metrology Sales and Service Agreement for Taiwan, China and Singapore

Metryx Receives Queen's Award for Innovation

Metryx to Host One-Day Mass Metrology Seminar at Imec

Metryx Receives Multiple System Follow-On Order from Inotera

Metryx and IMEC Enter Joint Development Program for Sub-32nm Metrology

Metryx Receives Two IC Industry Awards from EuroAsia Semiconductor